Sulphur Analyzer

The Sindie® On-Line model is an industrial grade process sulfur analyzer designed for continuous sulfur monitoring at, e.g. pipeline terminals, to monitor fuel interface cuts and tank contamination prevention where measurement speed and reliability are essential with minimal maintenance requirements. It can also be used at refineries for monitoring hydrotreating, hydrofiner, and blending processes. The Sindie analyzer has many advantages over competing technologies. The analyzer has exceptional signal-to-noise using monochromatic excitation of the X-ray source characteristic line. It does not require consumable gases or high temperature operations, improving the analyzer's robustness and reliability.

The main features of the Sindie-6000 on-line analyzer include:

• Direct measurement without sample conversion; Analysis in ppm (wt)
• LOD : 0.6 ppm
• Dynamic Range: 0.6 to 3000 ppm
• Outstanding linearity: One calibration for diesel and gasoline matrixes over full dynamic range
• Fast measurement time: 30 seconds to 5 minutes, user programmable
• No consumables, gases or high temperature processes
• Extremely low maintenance

Monochromatic Wavelength Dispersive
X-ray Fluorescence (MWD XRF)

Doubly curved crystals can be used to enhance conventional wavelength dispersive XRF instrumentation. These diffraction-based optics enable highly intense monochromatic X-ray beams using low-power, air-cooled X-ray tubes. These three dimensionally shaped optics selectively reflect a very narrow band of X-ray wavelengths for sample excitation, according to Bragg diffraction laws.

A monochromatic wavelength dispersive X-ray fluorescence (MWD XRF) analyzer uses two doubly curved crystal optics. Typical instrumentation includes a low-power X-ray tube, a point-to-point focusing optic for excitation, a sample cell, a second focusing optic for fluorescence collection, and an X-ray detector. The first focusing optic captures a narrow bandwidth of X-rays from the source and focuses this intense monochromatic beam to a small spot on the sample. The monochromatic primary beam excites the sample and secondary characteristic fluorescence X-rays are emitted. The second DCC collection optic collects only select characteristic X-ray wavelengths of interest within a narrow bandwidth.

This configuration offers several advantages over conventional WDXRF systems. The signal-to-background is improved by using the monochromatic excitation of the X-ray source characteristic line. Secondly the focusing ability of the collection optic allows using a small-area X-ray counter detector which results in low detector noise and enhanced reliability. Monochromatic excitation also provides simplified quantitation and matrix effect correction. This technique enables robust, low maintenance, online analyzers with dramatically lower detection limits and faster response times.

Monochromatic WDXRF using doubly curved crystal optics has the advantage of very high sensitivity for a specific sample element of interest. This technique has been successfully used for measurement of low levels of sulfur in petroleum products.

Related documents

On-Line Brochure (297.0 Kb)